A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons...
68 KB (8,229 words) - 03:11, 4 August 2025
The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs...
69 KB (8,297 words) - 18:04, 22 May 2025
Scanning transmission electron microscope (STEM) which is similar to TEM with a scanned electron probe Scanning electron microscope (SEM) which is similar...
48 KB (5,272 words) - 21:45, 2 August 2025
Atomic force microscope (AFM) Scanning electron microscope (SEM) Scanning ion-conductance microscopy (SICM) Scanning tunneling microscope (STM) Transmission...
53 KB (6,134 words) - 19:44, 27 June 2025
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with...
37 KB (4,321 words) - 07:16, 4 August 2025
transmission electron microscopy (HRTEM) Low-voltage electron microscope (LVEM) Precession electron diffraction Scanning confocal electron microscopy "Viruses"...
118 KB (15,040 words) - 14:16, 4 August 2025
built the first synchrotron-based X-ray microscope at the Cambridge Electron Accelerator. This microscope scanned samples using synchrotron radiation from...
22 KB (2,727 words) - 17:23, 23 April 2024
sciences Green fluorescent protein (GFP) Mercury-vapor lamp Microscope Scanning electron microscope § Cathodoluminescence Stokes shift Xenon arc lamp Spring...
25 KB (2,725 words) - 18:59, 26 June 2025
signal processing Environmental secondary detector, a gaseous detection device used with environmental scanning electron microscopes Equivalent spherical...
3 KB (347 words) - 07:46, 14 May 2024
There are two types of electron microscopes, the transmission electron microscope and the scanning electron microscope. Electron microscopy is a common...
24 KB (2,923 words) - 15:15, 5 July 2025
insulating surfaces is to use an environmental scanning electron microscope (ESEM). Therefore, in general, electrons are often not particularly suited...
37 KB (5,058 words) - 16:34, 18 July 2025
East Germany portal Technische Hochschule Dresden Environmental scanning electron microscope Raster scan Russian Alsos German inventors and discoverers "Manfred...
29 KB (3,346 words) - 05:57, 26 June 2025
in a scanning electron microscope (SEM), electron backscatter diffraction can be used to determine crystal orientation across the sample. Electron diffraction...
142 KB (15,551 words) - 06:01, 31 July 2025
all Gerasimos D. Danilatos, physicist and inventor of environmental scanning electron microscope Athanassios S. Fokas, Department of Applied Mathematics...
64 KB (7,143 words) - 06:12, 31 July 2025
Nanotechnology (section Scanning microscopes)
spark the growth of nanotechnology. First, the invention of the scanning tunneling microscope in 1981 enabled visualization of individual atoms and bonds...
71 KB (7,194 words) - 15:34, 24 June 2025
Gaseous detection device (redirect from Environmental secondary detector)
signals in the gaseous environment of an environmental scanning electron microscope (ESEM) and all scanned beam type of instruments that allow a minimum...
25 KB (3,766 words) - 17:03, 26 May 2025
Microscopy (section Scanning probe microscopy)
transmission electron microscopy) or by scanning a fine beam over the sample (for example confocal laser scanning microscopy and scanning electron microscopy)...
69 KB (8,287 words) - 09:36, 27 July 2025
1946) is a Greek-Australian physicist and inventor of the environmental scanning electron microscope (ESEM). He was born in Cefalonia, Greece. After the 1953...
3 KB (235 words) - 06:00, 17 August 2023
electron microscopy, i.e., transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and scanning electron microscope...
16 KB (1,709 words) - 18:14, 2 August 2023
Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local...
42 KB (5,218 words) - 01:25, 26 May 2025
probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)". Electrochimica Acta...
34 KB (4,279 words) - 15:57, 23 May 2025
owned by Leica and ZEISS. The integrated system comprises a scanning electron microscope (SEM) with a large specimen chamber, up to four light-element...
11 KB (1,283 words) - 12:35, 31 July 2025
the image is captured in a single frame, whereas the scanning electron microscope must move or scan across the sample while the stimuli is being applied...
8 KB (1,232 words) - 20:08, 26 October 2024
cells. Raman scattering Coherent Raman Scattering Microscopy Scanning electron microscope Tip-enhanced Raman spectroscopy Microscopical techniques in the...
17 KB (1,920 words) - 16:20, 1 August 2025
West, M. M.; Hitchcock, A. P. (2003). "Scanning Transmission X-Ray, Laser Scanning, and Transmission Electron Microscopy Mapping of the Exopolymeric Matrix...
7 KB (843 words) - 03:20, 9 July 2025
proportion of the chains, and with the latter, the chlorination reduces the electron density in the double bonds, therefore lowering their propensity to react...
9 KB (1,116 words) - 18:19, 5 October 2024
chemist Gerasimos Danilatos – physicist, inventor of environmental scanning electron microscope Michael Kyrios – clinical psychologist George North (Tramountanas)...
43 KB (4,031 words) - 12:01, 8 July 2025
Failure analysis (section Microscopes)
and techniques: Optical microscope Scanning acoustic microscope (SAM) Scanning electron microscope (SEM) Atomic force microscope (AFM) Stereomicroscope...
15 KB (1,765 words) - 03:35, 31 July 2024
X-ray (section Production by electrons)
If the electron has enough energy, it can knock an orbital electron out of the inner electron shell of the target atom. After that, electrons from higher...
116 KB (13,472 words) - 15:52, 31 July 2025
Environmental scanning electron microscope image of ozone cracks in NBR diaphragm seal formed at sharp corners in seal...
3 KB (345 words) - 14:25, 30 December 2024