• Aberration-corrected transmission electron microscopy (AC-TEM) is the general term for using electron microscopes where electro optical components are...
    20 KB (2,101 words) - 23:37, 22 May 2025
  • Thumbnail for Electron microscope
    resolution in situ environmental transmission electron microscopy and 1A aberration corrected in situ electron microscopy". Microscopy Research and Technique....
    48 KB (5,271 words) - 05:57, 20 June 2025
  • Thumbnail for Transmission Electron Aberration-corrected Microscope Project
    The Transmission Electron Aberration-corrected Microscope (TEAM) Project is a collaborative research project between four US laboratories and two companies...
    7 KB (826 words) - 03:43, 6 February 2025
  • Thumbnail for Scanning transmission electron microscopy
    ; Lupini, A. R. (2001). "Progress in aberration-corrected scanning transmission electron microscopy". Microscopy. 50 (3): 177–185. doi:10.1093/jmicro/50...
    37 KB (4,263 words) - 23:40, 22 May 2025
  • Thumbnail for Transmission electron microscopy
    Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The...
    118 KB (15,040 words) - 22:02, 23 June 2025
  • Thumbnail for Electron energy loss spectroscopy
    Electron energy loss spectroscopy (EELS) is a form of electron microscopy in which a material is exposed to a beam of electrons with a known, narrow range...
    22 KB (2,559 words) - 05:53, 7 April 2025
  • Photoemission electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a type of electron microscopy that utilizes local variations in electron emission...
    20 KB (2,699 words) - 11:28, 26 June 2025
  • Thumbnail for Activated carbon
    definite conclusion about which was correct. Recent work using aberration-corrected transmission electron microscopy has suggested that activated carbons...
    78 KB (8,911 words) - 23:51, 16 June 2025
  • Thumbnail for Electron diffraction
    scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) methods which uses a pixelated electron detector...
    143 KB (15,555 words) - 12:41, 24 June 2025
  • Thumbnail for High-resolution transmission electron microscopy
    High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of...
    20 KB (2,871 words) - 23:44, 30 May 2025
  • Thumbnail for Harald Rose
    of aberration-corrected transmission electron microscopy. Rose was born in Bremen. Rose received in 1964 his physics Diplom in theoretical electron optics...
    6 KB (454 words) - 15:47, 6 February 2025
  • Thumbnail for Transmission electron microscopy DNA sequencing
    Transmission electron microscopy DNA sequencing is a single-molecule sequencing technology that uses transmission electron microscopy techniques. The...
    28 KB (3,145 words) - 04:04, 9 June 2025
  • Thumbnail for Maximilian Haider
    in Nanoscience for the development of the aberration-corrected transmission electron microscopy in collaboration with Harald Rose and Knut Urban. Maximilian...
    6 KB (566 words) - 22:53, 7 February 2025
  • Thumbnail for Knut Urban
    Kavli Prize in Nanonoscience for the development of aberration-corrected transmission electron microscopy with Harald Rose and Maximilian Haider. Knut Urban...
    8 KB (815 words) - 13:43, 23 June 2025
  • Thumbnail for Microscopy
    light microscopy and transmission electron microscopy) or by scanning a fine beam over the sample (for example confocal laser scanning microscopy and scanning...
    69 KB (8,316 words) - 03:06, 19 June 2025
  • Thumbnail for Microscope
    Microscope (category Microscopy)
    D.; Kirkland, A.I. (2011). "Materials Advances through Aberration-Corrected Electron Microscopy" (PDF). MRS Bulletin. 31: 36–43. doi:10.1557/mrs2006.4...
    32 KB (3,699 words) - 22:04, 14 February 2025
  • Thumbnail for Precession electron diffraction
    Krivanek, O; Marks, LD; Murfitt, M (2007). "Aberration-corrected Precession Electron Diffraction". Microscopy and Microanalysis. 13 (S02). doi:10.1017/S1431927607078555...
    33 KB (4,332 words) - 20:13, 13 October 2024
  • Thumbnail for Optical microscope
    optical microscopy which do not use visible light include scanning electron microscopy and transmission electron microscopy and scanning probe microscopy and...
    53 KB (6,155 words) - 16:29, 24 May 2025
  • Thumbnail for Electron
    electrons accelerated across a 100,000-volt potential. The Transmission Electron Aberration-Corrected Microscope is capable of sub-0.05 nm resolution, which...
    155 KB (15,859 words) - 13:54, 24 June 2025
  • Thumbnail for Digital holographic microscopy
    not suffer from optical aberrations. Low cost In optical microscopy systems, optical aberrations are traditionally corrected by combining lenses into...
    49 KB (5,420 words) - 18:08, 24 May 2025
  • Thumbnail for Atomic force microscopy
    scanning tunneling microscopy and transmission electron microscopy. AFM can also be combined with a variety of optical microscopy and spectroscopy techniques...
    75 KB (9,793 words) - 22:06, 22 May 2025
  • Thumbnail for Contrast transfer function
    contrast transfer function (CTF) mathematically describes how aberrations in a transmission electron microscope (TEM) modify the image of a sample. This contrast...
    19 KB (2,946 words) - 13:43, 29 October 2024
  • (SEM) Scanning transmission electron microscope (STEM) Low-energy electron microscopy (LEEM) Electron diffraction Low-energy electron diffraction (LEED)...
    8 KB (1,045 words) - 22:13, 30 December 2023
  • focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy. However...
    7 KB (709 words) - 14:25, 16 September 2023
  • Thumbnail for Charge-coupled device
    image acquisition begins, allowing the conversion of incoming photons into electron charges at the semiconductor-oxide interface; the CCD is then used to read...
    50 KB (6,360 words) - 10:25, 22 June 2025
  • Thumbnail for Lena Kourkoutis
    field of electron microscopy, and a professor of applied and engineering physics at Cornell University. Her research focused on the use of aberration-corrected...
    7 KB (528 words) - 13:46, 9 October 2024
  • field measurements can be carried out using a spherical aberration corrected transmission electron microscope equipped with a large (11 mm) objective pole-piece...
    7 KB (611 words) - 20:29, 10 June 2025
  • Thumbnail for Department of Materials, University of Oxford
    required analysis. The electron Physical Science Imaging Centre (ePSIC) is a national facility for aberration-corrected electron microscopy. ePSIC was established...
    17 KB (1,661 words) - 09:13, 6 April 2025
  • Thumbnail for JEOL
    (September 2015). "Aberration-corrected STEM for atomic-resolution imaging and analysis: ABERRATION-CORRECTED STEM". Journal of Microscopy. 259 (3): 165–172...
    15 KB (1,313 words) - 14:56, 21 May 2025
  • of electron microscopes. Rempfer's innovations in electron microscopy extended to both transmission electron microscopy and photoemission electron microscopy...
    19 KB (1,782 words) - 20:52, 23 May 2025