• Scanning gate microscopy (SGM) is a scanning probe microscopy technique with an electrically conductive tip used as a movable gate that couples capacitively...
    2 KB (244 words) - 21:39, 16 March 2022
  • Scanning voltage microscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A...
    4 KB (456 words) - 00:21, 27 May 2025
  • Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded...
    29 KB (3,378 words) - 16:48, 23 May 2025
  • Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is positioned in contact or close proximity...
    7 KB (892 words) - 07:17, 25 March 2023
  • Thumbnail for Transmission electron microscopy
    Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen...
    118 KB (15,040 words) - 22:02, 23 June 2025
  • near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field. Among...
    92 KB (10,673 words) - 15:19, 27 June 2025
  • photoelectron spectroscopy (PES), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). In 1933, Ernst Brüche reported images of cathodes...
    20 KB (2,699 words) - 11:28, 26 June 2025
  • Thumbnail for Kelvin probe force microscope
    force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the...
    34 KB (4,279 words) - 15:57, 23 May 2025
  • Thumbnail for Conductive atomic force microscopy
    preamplifier for the current) is a strong advantage compared to scanning tunneling microscopy (STM). Basically, in STM the topography picture is constructed...
    50 KB (6,003 words) - 13:37, 9 June 2025
  • Thumbnail for Light sheet fluorescence microscopy
    times faster than those offered by point-scanning methods. This method is used in cell biology and for microscopy of intact, often chemically cleared, organs...
    42 KB (4,678 words) - 20:42, 9 June 2025
  • Thumbnail for Optical coherence tomography
    information obtained by coherence-gating through an axially scanning reference arm (Fig. 2). Two-dimensional lateral scanning has been electromechanically...
    91 KB (10,313 words) - 11:02, 9 June 2025
  • In microscopy, scanning joule expansion microscopy (SJEM) is a form of scanning probe microscopy heavily based on atomic force microscopy (AFM) that maps...
    19 KB (2,781 words) - 17:06, 5 June 2025
  • Scanning quantum dot microscopy (SQDM) is a scanning probe microscopy (SPM) that is used to image nanoscale electric potential distributions on surfaces...
    12 KB (1,600 words) - 12:02, 19 February 2025
  • by simulations as well as experiments at low temperature using scanning gate microscopy. A model with springs and ropes can show that a hung weight can...
    27 KB (3,634 words) - 01:44, 28 June 2025
  • Thumbnail for Environmental scanning electron microscope
    The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs...
    69 KB (8,297 words) - 18:04, 22 May 2025
  • Thumbnail for Nanotechnology
    example, feature-oriented scanning approach, atoms or molecules can be moved around on a surface with scanning probe microscopy techniques. Various techniques...
    71 KB (7,194 words) - 15:34, 24 June 2025
  • Thumbnail for Multi-tip scanning tunneling microscopy
    Multi-tip scanning tunneling microscopy (Multi-tip STM) extends scanning tunneling microscopy (STM) from imaging to dedicated electrical measurements...
    20 KB (2,169 words) - 21:10, 16 May 2024
  • Thumbnail for Molybdenum ditelluride
    laser-induced-metal phase of MoTe2 and its contact property via scanning gate microscopy". Nanotechnology. 31 (20): 205205. arXiv:2001.07860. Bibcode:2020Nanot...
    56 KB (6,480 words) - 05:55, 12 April 2025
  • developed. These are the scanning acoustic microscope (SAM), confocal scanning acoustic microscope (CSAM), and C-mode scanning acoustic microscope (C-SAM)...
    19 KB (2,463 words) - 02:10, 28 June 2025
  • Second Generation Multiplex DNA profiling system - also see SGM+ Scanning gate microscopy Spherical Grating Monochromator beamline of Canadian Light Source...
    2 KB (280 words) - 06:34, 23 May 2025
  • Thumbnail for Nanorobotics
    related to microscopy or scanning probe microscopy, instead of the description of nanorobots as molecular machines. Using the microscopy definition,...
    63 KB (7,287 words) - 09:49, 3 June 2025
  • of Variable Temperature Setup for Scanning Electron Microscopy in Gases and Liquids at Ambient Conditions. Microscopy and Microanalysis 21 (3),765-770...
    8 KB (1,232 words) - 20:08, 26 October 2024
  • logic gate Nanolithography Moore's law Semiconductor device fabrication Semiconductor scale examples Nanometrology Atomic force microscopy Scanning tunneling...
    17 KB (1,958 words) - 16:29, 2 June 2025
  • Thumbnail for Charge-coupled device
    imaging, Raman spectroscopy, super resolution microscopy as well as a wide variety of modern fluorescence microscopy techniques thanks to greater SNR in low-light...
    50 KB (6,360 words) - 16:49, 27 June 2025
  • 2019. Retrieved 14 May 2011. Binnig, G.; Rohrer, H. (1986). "Scanning tunneling microscopy". IBM Journal of Research and Development. 30 (4): 355–69. "Press...
    54 KB (5,795 words) - 20:55, 30 May 2025
  • Schottky barriers in carbon nanotube field-effect transistors via Scanning Gate Microscopy. Johnson has also achieved significant advancements in nanoscale...
    16 KB (1,324 words) - 14:23, 21 August 2024
  • temporarily applied to the patient at the appropriate resonance frequency. Scanning with X and Y gradient coils causes a selected region of the patient to...
    93 KB (10,805 words) - 01:11, 20 June 2025
  • Thumbnail for Materials science
    (characterization methods such as electron microscopy, X-ray diffraction, calorimetry, nuclear microscopy (HEFIB), Rutherford backscattering, neutron...
    65 KB (6,723 words) - 15:10, 27 June 2025
  • Thumbnail for Electron beam-induced current
    is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most...
    9 KB (1,086 words) - 20:52, 17 June 2025
  • historically involved both direct and indirect methodologies. Microscopy techniques, including Scanning Tunneling Microscope (STM), Atomic-Force Microscope (AFM)...
    38 KB (5,175 words) - 05:43, 24 May 2024