Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting...

respectively, qualifying it as a good alternative to copper. Resistance to electromigration, the process by which a metal conductor changes shape under the influence...

Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage...

total flux is composed of three elements: diffusion, advection, and electromigration. This implies that the concentration is affected by an ionic concentration...

the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase...

devices in general long after it should (in theory) have vanished. Electromigration, which means to physically move the atom to new locations (to physically...

orders of magnitude lower than the bulk resistance of the material Electromigration and growth of whiskers between nearby traces, aided by ionic residues...

noise. The lifetime of the CPU is also extended because of reduced electromigration, which varies exponentially with temperature. The technology is a concept...

work (blow) by electromigration, the phenomenon where electric flow causes the conductor material to move. Although electromigration is generally undesired...

gallium nitride are virtually insensitive to this kind of defect. Electromigration: This is caused by high current density and can move atoms out of the...

thermal runaway. Nonhomogenous distribution of current also aggravates electromigration effects and the formation of voids (see, e.g., the Kirkendall effect)...

from spontaneous diffusion, including drift current, electrophoresis, electromigration, thermodiffusion, sedimentation, in physical chemistry and materials...

National Accelerator Facility. Retrieved 28 April 2017. "Electromigration : What is electromigration?". Middle East Technical University. Retrieved 31 July...

and circuit failure. Soldered joints can fail in many ways including electromigration and the formation of brittle intermetallic layers. Some failures show...

miniaturization of electronic gates is causing the effects of phenomena like electromigration and subthreshold leakage to become much more significant. These newer...

main causes of transistor aging in MOSFETs are electromigration and charge trapping. Electromigration is the movement of ions caused by momentum from...

temperature. One of the unresolved challenges of electromigration are self-amplification effects of electromigration through self-heating at defects in interconnect...

material forming the interconnections actually moves, a phenomenon called electromigration. In superconductors excessive current density may generate a strong...

could occur in a metallic state. He is also known for his work on the electromigration of atoms, which later became an important consideration in semiconductor...

gate oxide breakdown (also time-dependent dielectric breakdown, TDDB) Electromigration (EM) Negative bias temperature instability (NBTI) Stress migration...

many small charge carriers, typically electrons, holes, ions (see Electromigration) or all three. When a magnetic field is present, these charges experience...

Chiou, Bi-Shiou (2001). "The effect of polyimide passivation on the electromigration of Cu multilayer interconnections". Journal of Materials Science: Materials...

circuits. ALF can model behavior, timing, power and noise, hot electron, electromigration, antenna effects, physical abstraction and physical implementation...

such as self-heating of the transistors, and other effects such as electromigration have become more evident since the 16nm node. In 2011, Intel demonstrated...

procedure that has irreversible effects on the test sample including electromigration, which limits the duration of such testing. Similar to frequency binning...

the range of all possible frequencies of electromagnetic radiation Electromigration, the transport of conducting solid material caused by electric current...

like in larger pore size filtration such as microfiltration), and 3) electromigration (attraction or repulsion from charges within and near the membrane)...

for manufacturing (DFM), design for test (DFT), and Design for X. Electromigration Application-specific integrated circuit Caltech Cosmic Cube Interface...

introduced new failure mechanism models for electromigration and highlighted a practical model for electromigration and its relationship to microstructure...

2019. Niazi, A.; Pieri, J. B.; Berger, E.; Jouty, R. (1975). "Note on electromigration of grain boundaries in silicon iron". Journal of Materials Science...