Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here...

function of the surface. A related technique, electrostatic force microscopy (EFM), directly measures the force produced on a charged tip by the electric...

sample must be electrically conductive. Atomic force microscopy (AFM) 1986, forces (atomic/electrostatic) between the tip and sample are sensed from the...

contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces (see magnetic force microscope, MFM), Casimir...

label Eight-to-fourteen modulation Electronic fetal monitoring Electrostatic force microscope Enterprise feedback management Environmental Fluid Mechanics...

of microscopes are the fluorescence microscope, electron microscope (both the transmission electron microscope and the scanning electron microscope) and...

An electrostatic lens is a device that assists in the transport of charged particles. For instance, it can guide electrons emitted from a sample to an...

microscope. In that same year, Reinhold Rudenberg, the scientific director of the Siemens company, patented an electrostatic lens electron microscope...

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of...

PMID 25008078. Schnurmann, Robert; Warlow-Davies, Eric (1942). "The electrostatic component of the force of sliding friction". Proceedings of the Physical Society...

microscopy EFM, electrostatic force microscopy KPFM, kelvin probe force microscopy MIM, microwave impedance microscopy MFM, magnetic force microscopy PFM...

Lindsay, S. M.; Leuba, S. H. (2000). "Single molecule force spectroscopy using the atomic force microscope". Prog. Biophys. Mol. Biol. 74 (1–2): 37–61. doi:10...

called the residual strong force. At distances smaller than 2.5 fm this force is much more powerful than the electrostatic force that causes positively charged...

measure electrostatic forces, elusive van der Waals forces, and even hydration or solvation forces. SFA is in some ways similar to using an atomic force microscope...

potential difference, Δψ, or "delta psi") in electrochemistry, is the electrostatic potential difference between two metals (or one metal and one electrolyte)...

it with electrostatic charge. The quartz fiber, having the same charge, is repelled by the surface of the electrode due to the coulomb force and bends...

electromagnetic fields. The term optics is used because magnetic and electrostatic lenses act upon a charged particle beam similarly to optical lenses...

FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image...

W=-e\phi -E_{\rm {F}},} where −e is the charge of an electron, ϕ is the electrostatic potential in the vacuum nearby the surface, and EF is the Fermi level...

1986. Binnig, Quate and Gerber also invented the analogous atomic force microscope that year. Second, fullerenes (buckyballs) were discovered in 1985...

confinement on an oxidation reaction under the sharp tip of an atomic force microscope. The first materials on which LON was demonstrated were Si(111) and...

attractive electrostatic forces are created when a voltage is applied between the static and moving combs causing them to be drawn together. The force developed...

volume ratio of MEMS, forces produced by ambient electromagnetism (e.g., electrostatic charges and magnetic moments), and fluid dynamics (e.g., surface tension...

1967 by Erwin Wilhelm Müller and J. A. Panitz. It combined a field ion microscope with a mass spectrometer having a single particle detection capability...

electron microscope (SEM) or atomic force microscope (AFM). Nanoprobing systems that are based on AFM technology are referred to as Atomic Force nanoProbers...

the electrostatic forces within matter interaction or, if an external magnetic field is present, the electron may be deflected by the Lorentz force. This...

asperities increases with pressure. The development of the atomic force microscope (ca. 1986) enabled scientists to study friction at the atomic scale...

is electrostatic force, E is electrostatic field, L is length, V is voltage and Q is charge. Despite the scaling nature of the electrostatic force it...

A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures...

focused and used for applications like cathode ray tubes, electron microscopes, electron beam welding, lithography and particle accelerators that generate...