• Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded...
    29 KB (3,378 words) - 16:48, 23 May 2025
  • Thumbnail for Atomic force microscopy
    Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated...
    75 KB (9,793 words) - 22:06, 22 May 2025
  • Thumbnail for Scanning tunneling microscope
    A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned...
    48 KB (7,167 words) - 16:59, 28 May 2025
  • Thumbnail for Kelvin probe force microscope
    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster...
    34 KB (4,279 words) - 15:57, 23 May 2025
  • Thumbnail for Near-field scanning optical microscope
    Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation...
    24 KB (2,854 words) - 00:51, 21 December 2024
  • Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local...
    42 KB (5,218 words) - 01:25, 26 May 2025
  • Thumbnail for Microscopy
    scanning microscopy and scanning electron microscopy). Scanning probe microscopy involves the interaction of a scanning probe with the surface of the...
    69 KB (8,316 words) - 19:07, 23 May 2025
  • Scanning voltage microscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A...
    4 KB (456 words) - 00:21, 27 May 2025
  • Thumbnail for Scanning electron microscope
    A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons...
    68 KB (8,229 words) - 11:38, 16 May 2025
  • Thumbnail for Non-contact atomic force microscopy
    force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy...
    35 KB (4,141 words) - 10:56, 24 May 2025
  • Thumbnail for Piezoresponse force microscopy
    with sample topography. The Band Excitation (BE) technique for scanning probe microscopy uses a precisely determined waveform that contains specific frequencies...
    26 KB (3,243 words) - 02:37, 3 May 2025
  • Thumbnail for Scanning thermal microscopy
    Scanning thermal microscopy (SThM) is a type of scanning probe microscopy that maps the local temperature and thermal conductivity of an interface. The...
    11 KB (1,240 words) - 16:41, 4 May 2025
  • Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons...
    26 KB (3,643 words) - 14:31, 24 May 2025
  • The operation of a photon scanning tunneling microscope (PSTM) is analogous to the operation of an electron scanning tunneling microscope, with the primary...
    26 KB (3,555 words) - 19:57, 28 December 2023
  • Thumbnail for Conductive atomic force microscopy
    AFM (LC-AFM), conductive probe AFM (CP-AFM), conductive scanning probe microscopy (C-SPM) or conductive scanning force microscopy (C-SFM), although CAFM...
    50 KB (5,994 words) - 09:40, 15 April 2025
  • Thumbnail for Microscope
    Microscope (category Microscopy)
    transmission electron microscope and the scanning electron microscope) and various types of scanning probe microscopes. Although objects resembling lenses...
    32 KB (3,699 words) - 22:04, 14 February 2025
  • Scanning probe lithography (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write...
    23 KB (2,368 words) - 07:29, 25 November 2024
  • Thumbnail for Nanotechnology
    are made. Scanning probe microscopy is an important technique both for characterization and synthesis. Atomic force microscopes and scanning tunneling...
    71 KB (7,194 words) - 18:10, 30 April 2025
  • Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is positioned in contact or close proximity...
    7 KB (892 words) - 07:17, 25 March 2023
  • of probe-based tools began with the invention of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), collectively called scanning probe...
    72 KB (8,212 words) - 13:26, 17 August 2024
  • Thumbnail for Scanning ion-conductance microscopy
    Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. SICM allows for the determination...
    15 KB (1,986 words) - 15:52, 26 June 2024
  • Scanning gate microscopy (SGM) is a scanning probe microscopy technique with an electrically conductive tip used as a movable gate that couples capacitively...
    2 KB (244 words) - 21:39, 16 March 2022
  • Thumbnail for Scanning SQUID microscopy
    In condensed matter physics, scanning SQUID microscopy is a technique where a superconducting quantum interference device (SQUID) is used to image surface...
    39 KB (5,449 words) - 06:36, 27 March 2025
  • Thumbnail for Scanning helium microscopy
    physical scanning probe. Scanning probe microscopies raster a small probe across the surface of a sample and monitor the interaction of the probe with the...
    37 KB (5,058 words) - 22:21, 23 May 2025
  • The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and...
    50 KB (6,275 words) - 09:25, 25 November 2024
  • Thumbnail for Optical microscope
    optical microscopy which do not use visible light include scanning electron microscopy and transmission electron microscopy and scanning probe microscopy and...
    53 KB (6,155 words) - 16:29, 24 May 2025
  • 2019. Retrieved 14 May 2011. Binnig, G.; Rohrer, H. (1986). "Scanning tunneling microscopy". IBM Journal of Research and Development. 30 (4): 355–69. "Press...
    54 KB (5,795 words) - 16:01, 22 May 2025
  • Scanning microscopy may refer to: Scanning probe microscopy Atomic force microscopy Scanning tunneling microscope Scanning electron microscope Scanning...
    302 bytes (57 words) - 21:48, 24 October 2018
  • Thumbnail for Surface science
    applied potential, time and solution conditions using spectroscopy, scanning probe microscopy and surface X-ray scattering. These studies link traditional electrochemical...
    22 KB (2,476 words) - 02:52, 26 November 2024
  • Thumbnail for Scanning Hall probe microscope
    Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning...
    5 KB (535 words) - 18:32, 28 May 2025