• Thumbnail for Ellipsometry
    Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry...
    24 KB (3,310 words) - 04:34, 6 December 2023
  • Thumbnail for Polarization (waves)
    ellipsometry relies on reflection, it is not required for the sample to be transparent to light or for its back side to be accessible. Ellipsometry can...
    74 KB (9,422 words) - 01:29, 24 May 2025
  • nontrivial scattering problems, which find applications in magneto-optics. In ellipsometry, Kramer-Kronig relations are applied to verify the measured values for...
    23 KB (3,018 words) - 22:36, 23 May 2025
  • Thumbnail for Periodic table
    (2018). "The direct bandgap of gray α-tin investigated by infrared ellipsometry". Applied Physics Letters. 113 (23): 232104. Bibcode:2018ApPhL.113w2104C...
    252 KB (27,179 words) - 14:30, 25 May 2025
  • Thumbnail for John Woollam (physicist)
    Company, an ellipsometry company based in Lincoln, Nebraska, and a world leader in the research, development, and commercialization of ellipsometry instruments...
    9 KB (868 words) - 05:45, 25 May 2025
  • can still exist through inaccurate detection of the photons. Classical ellipsometry is a thin film material characterization methodology used to determine...
    17 KB (2,079 words) - 21:51, 24 May 2025
  • polarimetry of astronomical objects, strain-induced birefringence, and ellipsometry. Later developers of the photoelastic modulator include J.C Kemp, S.N...
    5 KB (711 words) - 16:27, 15 December 2024
  • Thumbnail for X-ray reflectivity
    X-rays and is related to the techniques of neutron reflectometry and ellipsometry. The basic principle of X-ray reflectivity is to reflect a beam of X-rays...
    17 KB (2,455 words) - 21:26, 24 May 2025
  • Thumbnail for Thin-film interference
    thickness of the thin-film. Ellipsometry is a technique that is often used to measure properties of thin films. In a typical ellipsometry experiment polarized...
    22 KB (3,238 words) - 02:40, 2 April 2025
  • Thumbnail for Refractive index
    (see Brix). Calculation of glass properties Clausius–Mossotti relation Ellipsometry Fermat's principle Index ellipsoid Index-matching material Laser Schlieren...
    82 KB (9,202 words) - 01:21, 24 May 2025
  • surface which is capable of achieving ultralow fouling (<5 ng/cm2). Ellipsometry, a form of sensitive polarized optical spectroscopy, allows for the measurement...
    20 KB (2,517 words) - 23:12, 24 October 2023
  • Thumbnail for List of refractive indices
    {SiO2} determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry" (PDF). Physical Review B. 72 (20): 205117. Bibcode:2005PhRvB..72t5117T...
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  • light from some beetles (e.g. Cetonia aurata) is elliptical polarized. Ellipsometry Fresnel rhomb Photon polarization Sinusoidal plane-wave solutions of...
    8 KB (1,128 words) - 13:17, 21 May 2024
  • thickness and characteristics of the thin film, including surface profilers, ellipsometry, dual polarisation interferometry and scanning electron microscopy of...
    3 KB (400 words) - 06:02, 3 May 2024
  • Thumbnail for Birefringence
    change in polarization state using such an apparatus is the basis of ellipsometry, by which the optical properties of specular surfaces can be gauged through...
    60 KB (6,595 words) - 19:25, 24 May 2025
  • Otto Rudolph established continued to evolve, making breakthroughs in ellipsometry including the first production-oriented ellipsometer for thin, transparent...
    12 KB (1,186 words) - 23:29, 13 March 2025
  • Center for Materials and Nanoscience. He is a specialist in spectroscopic ellipsometry and has contributed to the development of blue and white LED, fast processors...
    14 KB (1,204 words) - 21:20, 12 April 2025
  • Thumbnail for Calcite
    anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry". Thin Solid Films. 313–314 (1–2): 341–346. Bibcode:1998TSF...313..341T...
    46 KB (4,831 words) - 20:25, 9 April 2025
  • Altimeter, height Distance measuring equipment (aviation) Ellipsometry#Imaging ellipsometry Frequency-modulated continuous-wave radar (FMCW) Length scale...
    26 KB (3,428 words) - 07:29, 16 December 2024
  • specialized in electrical engineering. His doctoral research explored quantum ellipsometry of semiconductors. At Boston, he was awarded a Gates Millennium Fellowship...
    11 KB (1,012 words) - 12:44, 6 May 2025
  • Thumbnail for Dispersion relation
    causality in the scattering theory of all types of waves and particles. Ellipsometry Ultrashort pulse Waves in plasmas Ablowitz 2011, pp. 19–20. F. A. Jenkins...
    15 KB (1,909 words) - 17:16, 8 February 2025
  • Thumbnail for Polarimetry
    one plane. Polarimetry of thin films and surfaces is commonly known as ellipsometry. Polarimetry is used in remote sensing applications, such as planetary...
    13 KB (1,566 words) - 11:03, 25 May 2025
  • Thumbnail for Solar cell
    protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry". Solar Energy Materials and Solar Cells. 78 (1–4): 143. Bibcode:2003SEMSC...
    147 KB (16,407 words) - 20:24, 22 May 2025
  • Thumbnail for NanoPutian
    substrate was then dipped into the solution and incubated for four days. Ellipsometry was used to determine the resulting thickness of the compound, and it...
    13 KB (1,442 words) - 11:06, 19 March 2025
  • properties of materials and thin films, and the technology of spectroscopic ellipsometry (SE). SE is a metrology that is used in the manufacture of integrated...
    4 KB (467 words) - 21:06, 16 July 2024
  • Thumbnail for Indium phosphide
    refractive index of InP and its oxide measured by multiple-angle incident ellipsometry", Journal of Materials Science Letters, 12 (10): 721, doi:10.1007/BF00626698...
    10 KB (754 words) - 14:26, 12 March 2025
  • Thumbnail for Nanocharm
    collaboration is to establish and enhance ellipsometry and polarimetry as a measurement tool. Ellipsometry and polarimetry are methods to characterize...
    2 KB (181 words) - 14:08, 12 August 2024
  • Thumbnail for Semiconductor device fabrication
    various processing steps. For example, thin film metrology based on ellipsometry or reflectometry is used to tightly control the thickness of gate oxide...
    113 KB (11,784 words) - 00:35, 25 May 2025
  • similar to the often complementary techniques of X-ray reflectivity and ellipsometry. The technique provides valuable information over a wide variety of scientific...
    7 KB (854 words) - 07:23, 25 July 2023
  • experiment Some well-known experimental techniques include: Crystallography Ellipsometry Faraday cage Interferometry NMR Laser cooling Laser spectroscopy Raman...
    15 KB (1,761 words) - 17:01, 23 April 2025